May 21-23, 2019 | Anaheim Convention Center | Anaheim, CA

John Jurewicz

John Jurewicz

Leader of Technology Optimization - Walbridge Technologies

Biography

Mr. Jurewicz has 30 years of experience with design, estimating, modeling and management of complex projects. Specializing in technology which integrates information modeling for construction and operations as well as design, His focus is on the value achieved through the re-use of data, reducing hazards and reducing the outage time as well as increasing plant productivity. Working for clients in Energy distribution, Automotive, Aviation, metals manufacturing and numerous Universities he has specialized research in the use of mobile scanning for optimization. He has spoken on similar topics at SPAR in the last 3 years and has also presented recently to the AIA, AGC and ENR Futuretech.

All presentations by John Jurewicz

The Hidden Value of Mobile Scanning

Thursday, June 7, 2018
11:10 am - 11:30 am
303A
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